Job ID: CN094

Job Responsibilities:

1. Responsible for the design, development, and maintenance of mass production test programs for CIS camera modules (CCM) and cross-platform tool software.
2. Develop and optimize test tool UI interfaces and interactions to improve production line test efficiency.
3. Familiar with CCM structure and imaging principles; formulate/optimize module mass production test plans.
4. Analyze test algorithm principles and resolve production line issues such as test failures, low yield, and poor stability.
5. Proficient in C++, Python, and other programming languages; responsible for developing mass production test tools, automated test scripts, and test algorithms.
6. Skilled in using C++ for core test logic development, cross-platform secondary development library packaging, and iterative optimization.
7. Interface with chip vendors and equipment manufacturers to complete test platform adaptation and mass production rollout.
8. Output test specifications, SOPs, and problem analysis reports.

Job Requirements:

1. Bachelor’s degree (3 years of experience) or master’s degree (2 years of experience) in Electronics, Automation, Computer Science, Optoelectronics, Measurement & Control, or related fields.

Required Technical Skills:

1. Proficient in C++ programming, capable of independently developing test software and dynamic libraries for Windows/Linux platforms.
2. UI development capability, familiar with at least one UI framework: Qt / MFC / WinForm.
3. Familiar with CIS imaging principles and CCM module structure.
4. Understand the principles of CIS module test algorithms: OTP, DPC, LSC, AE, AF, AWB, etc.
5. Familiar with mass production test processes and test items.
6. Able to read test equipment communication protocols; proficient with MIPI / I2C / UART / USB, etc.

Nice-to-Have (Plus Points):

• Familiarity with CIS chips from Sony, Samsung, OmniVision, GalaxyCore, etc.
• Experience in production line automated testing, machine vision, or image processing.
• Ability to independently optimize test algorithms to improve yield and test efficiency.